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目的：探讨7-9 岁高功能自闭症儿童面孔加工时事件相关电位（Electrical event-relateds, ERP）的变化及其意义。方法：选择 7-9 岁自闭症儿童（实验组）与普通儿童（对照组）各15 名，以中国人中性面孔及常见物件为刺激材料，记录和比较两类儿童在面孔刺激下的脑电成分。结果：剔除无效数据后，有效被试：实验组12 人、对照组14 人，两组年龄和性别组成无显著性差异（P>0. 05）。而，自闭症组按键反应时间、面孔反应时间显著长于对照组（按键反应F=9.26，P<0.05；面孔反应t=5.32，P<0.05）。在面孔刺激因素下，自闭症组平均波峰明显小于对照组（t=4.62，P<0.05）。在物件刺激因素下，两组平均波峰无显著差异（t=0.21，P>0.05）。而两组的潜伏期组别主效应不显著（F=1.63,P>0.05）。结论：自闭症儿童面孔结构编码过程异常，对面孔的关注度比普通儿童低。本文证实了自闭症儿童知觉/认知缺陷的存在，为更进一步研究提供了理论依据。

英文摘要:

Objective:To investigate the changes and value of electrical event-relates (ERP) in high functional autistic children.Methods:Fifteen high functional autistic children in age 7-9 (experimental group) and fifteen normal children in the same age (control group) were selected in this study. Photos of Chinese faces with neutral facial expression and normal objects were used as stimulation material. ERP were recorded, and the results were compared between groups.Results:After kicking out the invalid data, we got 12 valid participations in experimental group, and 14 in control group. No significantly differences were found in age and gender between groups. However, the key reaction time and face reaction time in experimental group were significantly longer than control group (key reaction time F=9.26, P<0.05; face reaction time t=5.32, P<0.05). When stimulated by face photos, the average wave of experimental group was significantly higher than control group (t=4.62, P<0.05). However, no significantly results were found when stimulation material was normal objects (t=0.21, P>0.05). The differences of main effect between groups in incubation period were not significant (F=1.63, P>0.05).Conclusion:The facial processing of autistic children is abnormal. Compare to normal children, they have lower facial attention. This study suggested that the dysfunction of perception/ cognitive processing exists in autistic children. This result provided a basis for further study.

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